TEST & BURN IN SOCKET
A vital part of the semiconductor manufacturing process, Yamaichi continues to be the mainstay of test and burn-in sockets for virtually all IC package types including CSP, BGA, FBGA, QFP, LGA, and QFN packages. Our newest products include coaxial test contactors and wafer-level chip scale packaging.
Katana Series Test Contactors
Yamaichi’s Katana Series of test contactors use a co-axial design methodology that offers the best possible electrical performance without sacrificing mechanical reliability. You’ve invested time and money into developing your device - don’t let inadequate contactors skew your data.
Benefit from our precision manufacturing as well as our unique technologies such as CSH™ Coating or our Homogenous Alloy spring probes to improve your yield and throughput.
Y-Vertical Series Probe Heads
Replace your expensive cantilever or cobra style probe heads with Yamaichi’s spring probe based vertical probe heads and realize big improvements in your cost of test.
Benefit from our precision engineering and high quality manufacturing as well as our unique technologies like CSH™ Coating or our Homogenous Alloy probes to improve your yield and throughput.
IC120 Series
IC191 Series
IC234 Series
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